Refractive Index Sensing Imaging Technology Based on Optical Surface Wave

Chonglei Zhang; Ziqiang Xin; Changjun Min; Xiaocong Yuan

doi:10.3788/AOS201939.0126009

Journals >Acta Optica Sinica >Volume 39 >Issue 1 >Page 0126009 > Article

Acta Optica Sinica
Vol. 39, Issue 1, 0126009 (2019)

Refractive Index Sensing Imaging Technology Based on Optical Surface Wave

Chonglei Zhang^*, Ziqiang Xin, Changjun Min, and Xiaocong Yuan^*

Author Affiliations

Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology, Shenzhen University, Shenzhen, Guangdong 518060, China

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DOI: 10.3788/AOS201939.0126009 Cite this Article Set citation alerts

Chonglei Zhang, Ziqiang Xin, Changjun Min, Xiaocong Yuan. Refractive Index Sensing Imaging Technology Based on Optical Surface Wave[J]. Acta Optica Sinica, 2019, 39(1): 0126009 Copy Citation Text

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Chonglei Zhang, Ziqiang Xin, Changjun Min, Xiaocong Yuan. Refractive Index Sensing Imaging Technology Based on Optical Surface Wave[J]. Acta Optica Sinica, 2019, 39(1): 0126009

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