• Acta Optica Sinica
  • Vol. 39, Issue 1, 0126009 (2019)
Chonglei Zhang*, Ziqiang Xin, Changjun Min, and Xiaocong Yuan*
Author Affiliations
  • Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology, Shenzhen University, Shenzhen, Guangdong 518060, China
  • show less
    DOI: 10.3788/AOS201939.0126009 Cite this Article Set citation alerts
    Chonglei Zhang, Ziqiang Xin, Changjun Min, Xiaocong Yuan. Refractive Index Sensing Imaging Technology Based on Optical Surface Wave[J]. Acta Optica Sinica, 2019, 39(1): 0126009 Copy Citation Text show less

    Abstract

    The principle of surface wave, classification of measurement technology and key technology are discussed. The historical developments of refractive index sensing based on total internal reflection, surface plasmon resonance, graphene and other optical surface waves is summarized. The technical advantages of surface wave refractive index sensing imaging are further discussed. The research results show that surface wave sensing imaging, as a high-precision quantitative label-free microscopic imaging technology, has important values in the accurate diagnosis and treatment of medical optics.
    Chonglei Zhang, Ziqiang Xin, Changjun Min, Xiaocong Yuan. Refractive Index Sensing Imaging Technology Based on Optical Surface Wave[J]. Acta Optica Sinica, 2019, 39(1): 0126009
    Download Citation