Quantitative Analysis of Cu(In,Ga)Se2 Thin Films Deposited by Magnetron Sputtering Technology Using Laser-Induced Breakdown Spectroscopy

Lili Dong; Shiming Liu; Junshan Xiu

doi:10.3788/LOP57.233003

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 23 >Page 233003 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 23, 233003 (2020)

Quantitative Analysis of Cu(In,Ga)Se₂ Thin Films Deposited by Magnetron Sputtering Technology Using Laser-Induced Breakdown Spectroscopy

Lili Dong¹, Shiming Liu², and Junshan Xiu^2、*

Author Affiliations

¹School of Chemistry and Chemical Engineering of Shandong University of Technology, Zibo, Shandong 255049, China

²School of Physics and Optoelectronic Engineering, Shandong University of Technology, Zibo, Shandong 255049, China

show less

DOI: 10.3788/LOP57.233003 Cite this Article Set citation alerts

Lili Dong, Shiming Liu, Junshan Xiu. Quantitative Analysis of Cu(In,Ga)Se₂ Thin Films Deposited by Magnetron Sputtering Technology Using Laser-Induced Breakdown Spectroscopy[J]. Laser & Optoelectronics Progress, 2020, 57(23): 233003 Copy Citation Text

show less

Cited By

Article index updated: May. 27, 2024

Citation counts are provided from Researching.

The article is cited by 1 article(s) from Researching.