• Journal of Semiconductors
  • Vol. 42, Issue 9, 092101 (2021)
Fangxing Zha1, Qiuying Zhang1, Haoguang Dai1, Xiaolei Zhang2、3, Li Yue2, Shumin Wang4, and Jun Shao5
Author Affiliations
  • 1Physics Department, Shanghai University, Shanghai 200444, China
  • 2Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
  • 3School of Information Science and Technology, Shanghai Tech University, Shanghai 201210, China
  • 4Department of Microtechnology and Nanoscience, Chalmers University of Technology, 41296 Gothenburg, Sweden
  • 5National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
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    DOI: 10.1088/1674-4926/42/9/092101 Cite this Article
    Fangxing Zha, Qiuying Zhang, Haoguang Dai, Xiaolei Zhang, Li Yue, Shumin Wang, Jun Shao. The scanning tunneling microscopy and spectroscopy of GaSb1–xBix films of a few-nanometer thickness grown by molecular beam epitaxy[J]. Journal of Semiconductors, 2021, 42(9): 092101 Copy Citation Text show less
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    Fangxing Zha, Qiuying Zhang, Haoguang Dai, Xiaolei Zhang, Li Yue, Shumin Wang, Jun Shao. The scanning tunneling microscopy and spectroscopy of GaSb1–xBix films of a few-nanometer thickness grown by molecular beam epitaxy[J]. Journal of Semiconductors, 2021, 42(9): 092101
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