• Journal of Infrared and Millimeter Waves
  • Vol. 43, Issue 3, 329 (2024)
Rui-Ze FENG1,2, Shu-Rui CAO1,2, Zhi-Yu FENG1,2, Fu-Gui ZHOU1,2..., Tong LIU1, Yong-Bo SU1,2 and Zhi JIN1,2,*|Show fewer author(s)
Author Affiliations
  • 1High-Frequency High-Voltage Device and Integrated Circuits Center,Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China
  • 2School of Integrated Circuits,University of Chinese Academy of Sciences,Beijing 100049,China
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    DOI: 10.11972/j.issn.1001-9014.2024.03.006 Cite this Article
    Rui-Ze FENG, Shu-Rui CAO, Zhi-Yu FENG, Fu-Gui ZHOU, Tong LIU, Yong-Bo SU, Zhi JIN. InGaAs/InAlAs InP-based HEMT with the current cutoff frequency of 441 GHz[J]. Journal of Infrared and Millimeter Waves, 2024, 43(3): 329 Copy Citation Text show less
    A schematic cross-section of InP-based HEMT
    Fig. 1. A schematic cross-section of InP-based HEMT
    The EBL process with a PMMA/Al/UVIII resist stack
    Fig. 2. The EBL process with a PMMA/Al/UVIII resist stack
    SEM photograph of the T-Gate and gate recess of the InGaAs/InAlAs HEMT
    Fig. 3. SEM photograph of the T-Gate and gate recess of the InGaAs/InAlAs HEMT
    (a) DC output characteristics, (b) gm against IDS, and (c) transfer characteristics of the HEMT
    Fig. 4. (a) DC output characteristics, (b) gm against IDS, and (c) transfer characteristics of the HEMT
    (a) The measured and modeled H21, MAG/MSG and U gains versus frequency for the Lg = 54.4 nm InGaAs/InAlAs HEMT at VGS = -0.35 V and VDS = 0.7 V, and (b) small-signal equivalent circuit model used in pervious work[16]
    Fig. 5. (a) The measured and modeled H21, MAG/MSG and U gains versus frequency for the Lg = 54.4 nm InGaAs/InAlAs HEMT at VGS = -0.35 V and VDS = 0.7 V, and (b) small-signal equivalent circuit model used in pervious work[16]
    Measured fT against IDS of the Lg = 54.4 nm InGaAs/InAlAs HEMT with VDS = 0.7 V
    Fig. 6. Measured fT against IDS of the Lg = 54.4 nm InGaAs/InAlAs HEMT with VDS = 0.7 V
    Cgs [fF/mm]Cgd [fF/mm]Cds [fF/mm]gmi [mS/mm]gds [mS/mm]Ri [Ω•mm]Rg [Ω•mm]
    322.1134.11 1242 431597.70.010.346 6
    RD [Ω•mm]RS [Ω•mm]Rgs [Ω•mm]Rgd [Ω•mm]fT_measure [GHz]fT_model [GHz]fmax_model [GHz]
    0.538 30.159 9375.93 617441443299
    Table 1. Small-signal model parameters of the Lg = 54.4 nm InGaAs/InAlAs HEMTs at VDS= 0.7 V, with different structures
    Ref.Lg /nmGate metalChannelgm /(mS/mm)fT /GHz (VDS /V)fmax /GHz (VDS /V)
    1750Pt/Ti/Pt/AuInAs2 000496 (0.6)400 (0.6)
    1850Pt/Ti/Pt/AuIn0.7Ga0.3As1 750465 (0.75)1 060 (0.75)
    1960Pt/Ti/Pt/AuInAs2 100580 (0.6)675 (0.6)
    2060Pt/Ti/Pt/AuInAs2 114710 (0.5)478 (0.5)
    2170Ti/Pt/AuIn0.7Ga0.3As1 600310 (1.2)540 (1.2)
    2275Ti/Pt/AuInAs1 331260 (1.0)800 (1.0)
    This work54.4Ti/Pt/AuIn0.53Ga0.47As1 265441 (0.7)299 (0.7)
    Table 2. Comparison with published InGaAs(InAs)/InAlAs HEMTs with Lg from 50 nm to 75 nm
    Rui-Ze FENG, Shu-Rui CAO, Zhi-Yu FENG, Fu-Gui ZHOU, Tong LIU, Yong-Bo SU, Zhi JIN. InGaAs/InAlAs InP-based HEMT with the current cutoff frequency of 441 GHz[J]. Journal of Infrared and Millimeter Waves, 2024, 43(3): 329
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