• Journal of Semiconductors
  • Vol. 40, Issue 12, 122101 (2019)
M. Akura1, G. Dunn1、2, and M. Missous3
Author Affiliations
  • 1Department of Electrical and Electronic Engineering, University of Aberdeen, Aberdeen City AB24 3UE, UK
  • 2Department of Physics, University of Aberdeen, Aberdeen City AB24 3UE, UK
  • 3School of Electrical and Electronic Engineering, University of Manchester, Manchester M13 9PL, UK
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    DOI: 10.1088/1674-4926/40/12/122101 Cite this Article
    M. Akura, G. Dunn, M. Missous. Hot electron effects on the operation of potential well barrier diodes[J]. Journal of Semiconductors, 2019, 40(12): 122101 Copy Citation Text show less
    References

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    M. Akura, G. Dunn, M. Missous. Hot electron effects on the operation of potential well barrier diodes[J]. Journal of Semiconductors, 2019, 40(12): 122101
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