• Infrared and Laser Engineering
  • Vol. 52, Issue 5, 20220838 (2023)
Xin Zhang1, Le Zhang1,*, Chi Song2,*, Lisong Yan3..., Xiaolin Yin1 and Binzhi Zhang1|Show fewer author(s)
Author Affiliations
  • 1JiHua Laboratory, Foshan 528200, China
  • 2School of Mechatronic Engineering and Automation, Foshan University, Foshan 528225, China
  • 3School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China
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    DOI: 10.3788/IRLA20220838 Cite this Article
    Xin Zhang, Le Zhang, Chi Song, Lisong Yan, Xiaolin Yin, Binzhi Zhang. Study on surface roughness of monocrystalline silicon carbide based on PSD evaluation and pseudo-random tool path[J]. Infrared and Laser Engineering, 2023, 52(5): 20220838 Copy Citation Text show less
    Deterministic tool path. (a) Grating tool path; (b) Helix tool path
    Fig. 1. Deterministic tool path. (a) Grating tool path; (b) Helix tool path
    Diagram of a pseudo-random tool path
    Fig. 2. Diagram of a pseudo-random tool path
    Roughness test by Zygo newview 9000 white-light interferometry
    Fig. 3. Roughness test by Zygo newview 9000 white-light interferometry
    Measurement results of white-light interferometry before machining
    Fig. 4. Measurement results of white-light interferometry before machining
    Measurement result of white-light interferometry after grating trajectory processing
    Fig. 5. Measurement result of white-light interferometry after grating trajectory processing
    PSD curve calculated by data of grating trajectory
    Fig. 6. PSD curve calculated by data of grating trajectory
    Roughness result after processing with pseudo-random trajectory
    Fig. 7. Roughness result after processing with pseudo-random trajectory
    PSD curve calculated by data of pseudo-random trajectory
    Fig. 8. PSD curve calculated by data of pseudo-random trajectory
    Xin Zhang, Le Zhang, Chi Song, Lisong Yan, Xiaolin Yin, Binzhi Zhang. Study on surface roughness of monocrystalline silicon carbide based on PSD evaluation and pseudo-random tool path[J]. Infrared and Laser Engineering, 2023, 52(5): 20220838
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