Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer

Zhizhong Zheng; Zhong Yang; Yuantian Qin; Liguo Wang

doi:10.3788/LOP57.053001

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 5 >Page 053001 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 5, 053001 (2020)

Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer

Zhizhong Zheng^1、3、*, Zhong Yang¹, Yuantian Qin², and Liguo Wang²

Author Affiliations

¹College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 211100, China

²College of Aeronautics, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China

³Nanjing Geological Survey Center, China Geological Survey, Nanjing, Jiangsu 210016, China

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DOI: 10.3788/LOP57.053001 Cite this Article Set citation alerts

Zhizhong Zheng, Zhong Yang, Yuantian Qin, Liguo Wang. Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer[J]. Laser & Optoelectronics Progress, 2020, 57(5): 053001 Copy Citation Text

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