In order to enable imaging spectrometer to be used in a complex vibration environment and a wide temperature range (5-35 ℃), we designed a short-wave infrared imaging spectrometer based on an optical system of convex gratings using Offner-type concentric structure. Patran & Nastran was used to conduce modal analysis, static load analysis, and thermal response analysis with respect to the optical-mechanical structure of the instrument to verify the rationality of structure design. Further, the generalized inverse matrix method was used to process the results obtained based on static load response analysis to obtain the surface deformation and rigid body displacement data with respect to optical element of the instrument. Under temperature of 0-40 ℃ and an acceleration load of 4 g, the root mean square (RMS) with respect to the optical surface deformation is less than 34 nm, the relative position change between the mirrors is less than 0.05 mm, and the eccentricity of mirrors is less than 0.05 mm, satisfying the requirements for the surface shape and rigid body displacement tolerance of the instrument. The vibration tests denote that the first mode of the imaging spectrometer is 559 Hz, which is considerably higher than that of general ambient excitation. The stiffness of the imaging spectrometer also satisfies the application requirement. The temperature experiments denote that the extreme wavelength drift is 0.306 pixel in a wide temperature range and that the extreme spectral bandwidth change is 0.493Δ, in which Δ is full width at half-maximum (FWHM). Furthermore, the environmental adaptability of the structural design is verified via engineering analyses and experiments, resulting in important practical value for instrument engineering.