• Journal of Semiconductors
  • Vol. 41, Issue 10, 102402 (2020)
Chenxia Wang, Jie Wei, Diao Fan, Yang Yang, and Xiaorong Luo
Author Affiliations
  • China State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China
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    DOI: 10.1088/1674-4926/41/10/102402 Cite this Article
    Chenxia Wang, Jie Wei, Diao Fan, Yang Yang, Xiaorong Luo. A snapback-free and high-speed SOI LIGBT with double trenches and embedded fully NPN structure[J]. Journal of Semiconductors, 2020, 41(10): 102402 Copy Citation Text show less
    References

    [1] N Iwamuro, T Laska. IGBT history, state-of-the-art, and future prospects. IEEE Trans Electron Devices, 64, 741(2017).

    [2] D Disney, T Letavic, T Trajkovic et al. High-voltage integrated circuits: History, state of the art, and future prospects. IEEE Trans Electron Devices, 64, 659(2017).

    [3] H Hu, H M Huang, X B Chen. A novel double-RESURF SOI lateral TIGBT with self-biased nMOS for improved VCE(sat)Eoff tradeoff relationship. IEEE Trans Electron Devices, 66, 814(2019).

    [4] D W Green, M Sweet, K V Vershinin et al. Performance analysis of the segment npn anode LIGBT. IEEE Trans Electron Devices, 52, 2482(2005).

    [5] W S Chen, B Zhang, Z J Li. Area-efficient fast-speed lateral IGBT with a 3-D n-region-controlled anode. IEEE Electron Device Lett, 31, 467(2010).

    [6]

    [7] B X Duan, L C Sun, Y T Yang. Analysis of the novel snapback-free LIGBT with fast-switching and improved latch-up immunity by TCAD simulation. IEEE Electron Device Lett, 40, 63(2019).

    [8] X R Luo, Z Y Zhao, L H Huang et al. A snapback-free fast-switching SOI LIGBT with an embedded self-biased n-MOS. IEEE Trans Electron Devices, 65, 3572(2018).

    [9]

    [10] L Zhang, J Zhu, W F Sun et al. A U-shaped channel SOI-LIGBT with dual trenches. IEEE Trans Electron Devices, 64, 2587(2017).

    [11] L Zhang, J Zhu, W F Sun et al. Comparison of short-circuit characteristics of trench gate and planar gate U-shaped channel SOI-LIGBTs. Solid-State Electron, 135, 24(2017).

    [12] M R Simpson. Analysis of negative differential resistance in the IV characteristics of shorted-anode LIGBT's. IEEE Trans Electron Devices, 38, 1633(1991).

    [13] J H Chul, D S Byeon, J K Oh et al. A fast-switching SOI SA-LIGBT without NDR region. 12th International Symposium on Power Semiconductor Devices & ICs, 149(2000).

    [14] J K O Sin, S Mukherjee. Lateral insulated-gate bipolar transistor (LIGBT) with a segmented anode structure. IEEE Electron Device Lett, 12, 45(1991).

    [15]

    [16] L Zhang, J Zhu, W F Sun et al. A high current density SOI-LIGBT with segmented trenches in the anode region for suppressing negative differential resistance regime. 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD), 49(2015).

    [17]

    [18]

    [19] Y T He, M Qiao, B Zhang. Ultralow turnoff loss dual-gate SOI LIGBT with trench gate barrier and carrier stored layer. Chin Phys B, 25, 127304(2016).

    [20] T Sun, X R Luo, J Wei et al. A carrier stored SOI LIGBT with ultralow ON-state voltage and high current capability. IEEE Trans Electron Devices, 65, 3365(2018).

    [21] X R Luo, Y Yang, T Sun et al. A snapback-free and low-loss shorted-anode SOI LIGBT with self-adaptive resistance. IEEE Trans Electron Devices, 66, 1390(2019).

    Chenxia Wang, Jie Wei, Diao Fan, Yang Yang, Xiaorong Luo. A snapback-free and high-speed SOI LIGBT with double trenches and embedded fully NPN structure[J]. Journal of Semiconductors, 2020, 41(10): 102402
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