Single-Event Upset and Damage Mechanism in 8T-Global Shutter CMOS Image Sensors

Bo Wang; Liheng Wang; Weixin Liu; Zebin Kong; Yudong Li; Zhen Li; Kunshu Wang; Weiming Zhu; Ming Xuan

doi:10.3788/AOS201939.0504001

Journals >Acta Optica Sinica >Volume 39 >Issue 5 >Page 0504001 > Article

Acta Optica Sinica
Vol. 39, Issue 5, 0504001 (2019)

Single-Event Upset and Damage Mechanism in 8T-Global Shutter CMOS Image Sensors

Bo Wang^1、*, Liheng Wang¹, Weixin Liu¹, Zebin Kong¹, Yudong Li², Zhen Li¹, Kunshu Wang¹, Weiming Zhu¹, and Ming Xuan¹

Author Affiliations

¹ Device Reliability Assurance Department, No.808 Institute of the Eighth Academy of China Aerospace Science and Technology Corporation, Shanghai 201109, China

² Radiation Effect Laboratory, Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi, Xinjiang 830011, China

show less

DOI: 10.3788/AOS201939.0504001 Cite this Article Set citation alerts

Bo Wang, Liheng Wang, Weixin Liu, Zebin Kong, Yudong Li, Zhen Li, Kunshu Wang, Weiming Zhu, Ming Xuan. Single-Event Upset and Damage Mechanism in 8T-Global Shutter CMOS Image Sensors[J]. Acta Optica Sinica, 2019, 39(5): 0504001 Copy Citation Text

show less

References