• Journal of Semiconductors
  • Vol. 42, Issue 5, 051001 (2021)
Enqing Zhang1,2, Zhengkun Xing1,2, Dian Wan1,2, Haoran Gao1,2..., Yingdong Han1,2, Yisheng Gao3, Haofeng Hu1,2, Zhenzhou Cheng1,2,4 and Tiegen Liu1,2|Show fewer author(s)
Author Affiliations
  • 1School of Precision Instruments and Opto-electronics Engineering, Tianjin University, Tianjin 300072, China
  • 2Key Laboratory of Opto-electronics Information Technology, Ministry of Education, Tianjin 300072, China
  • 3Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong, China
  • 4Department of Chemistry, The University of Tokyo, Tokyo 113-0033, Japan
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    DOI: 10.1088/1674-4926/42/5/051001 Cite this Article
    Enqing Zhang, Zhengkun Xing, Dian Wan, Haoran Gao, Yingdong Han, Yisheng Gao, Haofeng Hu, Zhenzhou Cheng, Tiegen Liu. Surface-enhanced Raman spectroscopy chips based on two-dimensional materials beyond graphene[J]. Journal of Semiconductors, 2021, 42(5): 051001 Copy Citation Text show less
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    Enqing Zhang, Zhengkun Xing, Dian Wan, Haoran Gao, Yingdong Han, Yisheng Gao, Haofeng Hu, Zhenzhou Cheng, Tiegen Liu. Surface-enhanced Raman spectroscopy chips based on two-dimensional materials beyond graphene[J]. Journal of Semiconductors, 2021, 42(5): 051001
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