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Journals >Journal of Semiconductors >Volume 43 >Issue 7 >Page 070202 > Article

Journal of Semiconductors
Vol. 43, Issue 7, 070202 (2022)

Perovskite films for X-ray detection

Pei Yuan¹, Lixiu Zhang², Menghua Zhu^1、*, and Liming Ding^2、**

Author Affiliations

¹State Key Laboratory of Solidification Processing, Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi’an 710072, China

²Center for Excellence in Nanoscience (CAS), Key Laboratory of Nanosystem and Hierarchical Fabrication (CAS), National Center for Nanoscience and Technology, Beijing 100190, China

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DOI: 10.1088/1674-4926/43/7/070202 Cite this Article

Pei Yuan, Lixiu Zhang, Menghua Zhu, Liming Ding. Perovskite films for X-ray detection[J]. Journal of Semiconductors, 2022, 43(7): 070202 Copy Citation Text

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References

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Pei Yuan, Lixiu Zhang, Menghua Zhu, Liming Ding. Perovskite films for X-ray detection[J]. Journal of Semiconductors, 2022, 43(7): 070202

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