1State Key Laboratory of Solidification Processing, Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi’an 710072, China
2Center for Excellence in Nanoscience (CAS), Key Laboratory of Nanosystem and Hierarchical Fabrication (CAS), National Center for Nanoscience and Technology, Beijing 100190, China
Fig. 1. (Color online) (a) Perovskite-filled membrane (PFM). (b) A 400 cm2 nylon membrane without (left) and with (right) perovskites. (c) Current density for the PFM device changes with the dose rate. (d) Dependence of the sensitivity and flexibility of PFM devices on device thicknesses. Inset: the bending of a PFM device. The error bars were obtained from three devices. Reproduced with permission[21], Copyright 2020, Springer Nature. (e) Illustration for an all-solution-processed X-ray detector. (f) Printed MPC on PI-MAPbI3. (g) Signal current and sensitivity change with bias voltage. Reproduced with permission[22], Copyright 2017, Springer Nature.
Fig. 2. (Color online) (a) The lamination technique. (b) Heterojunction perovskite film. (c) Response of single-composition and heterojunction perovskite detectors. Reproduced with permission[27], Copyright 2021, AAAS. (d) Wet film fabrication by spin-coating or blade-coating. (e) The ALS method. (f) The nucleation and growth process in (d). (g) Nucleation and growth process in ALS method. Reproduced with permission[30], Copyright 2021, Elsevier.