• Journal of Semiconductors
  • Vol. 41, Issue 12, 122101 (2020)
Dandan Ning1、2, Yanan Chen2、3, Xinkun Li4, Dechun Liang4, Shufang Ma1, Peng Jin2、3, and Zhanguo Wang2、3
Author Affiliations
  • 1Institute of Atomic and Molecular Science, Shaanxi University of Science and Technology, Xi’an 710021, China
  • 2Key Laboratory of Semiconductor Materials Science and Beijing Key Laboratory of Low-Dimensional Semiconductor Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 3Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • 4Beijing Institute of Aerospace Control Instruments, Beijing 100039, China
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    DOI: 10.1088/1674-4926/41/12/122101 Cite this Article
    Dandan Ning, Yanan Chen, Xinkun Li, Dechun Liang, Shufang Ma, Peng Jin, Zhanguo Wang. Research on the photoluminescence of spectral broadening by rapid thermal annealing on InAs/GaAs quantum dots[J]. Journal of Semiconductors, 2020, 41(12): 122101 Copy Citation Text show less
    (Color online) Schematic for the heteroepitaxy structure of InAs/GaAs QDs.
    Fig. 1. (Color online) Schematic for the heteroepitaxy structure of InAs/GaAs QDs.
    (Color online) (a) The PL spectrum of the as-grown QDs sample under 14 mW of excitation power at 16 and 300 K respectively. (b) The Gaussian fitting diagram of the PL spectrum of the as-grown QDs sample at 16 K, with the dash-dot lines showing the Gaussian fitting of different emission peaks.
    Fig. 2. (Color online) (a) The PL spectrum of the as-grown QDs sample under 14 mW of excitation power at 16 and 300 K respectively. (b) The Gaussian fitting diagram of the PL spectrum of the as-grown QDs sample at 16 K, with the dash-dot lines showing the Gaussian fitting of different emission peaks.
    (Color online) The normalized PL spectra of as-grown QDs and QDs annealed at various temperatures obtained at (a) 16 K and (b) 300 K under an excitation power of 14 mW. Inset: The PL peak energy of QDs at (a) T = 16 K and (b) T = 300 K with the change of annealing temperature, with the red curve representing small QDs and the black curve representing large QDs.
    Fig. 3. (Color online) The normalized PL spectra of as-grown QDs and QDs annealed at various temperatures obtained at (a) 16 K and (b) 300 K under an excitation power of 14 mW. Inset: The PL peak energy of QDs at (a) T = 16 K and (b) T = 300 K with the change of annealing temperature, with the red curve representing small QDs and the black curve representing large QDs.
    (Color online) (a) The PL spectral width of QDs at T = 16 K (denoted by red curve) and T = 300 K (denoted by blue curve) with the change of annealing temperature. (b) The integrated PL intensity at T = 16 K (denoted by red curve) and T = 300 K (denoted by blue curve) with the change of annealing temperature.
    Fig. 4. (Color online) (a) The PL spectral width of QDs at T = 16 K (denoted by red curve) and T = 300 K (denoted by blue curve) with the change of annealing temperature. (b) The integrated PL intensity at T = 16 K (denoted by red curve) and T = 300 K (denoted by blue curve) with the change of annealing temperature.
    (Color online) The top half of the figure shows the power-dependent PL spectrum of samples annealed at (a) 750, (b) 800, (c) 850, and (d) 900 °C recorded at 300 K. The PL spectrum of the annealed sample under an excitation power of 40 mW was extracted and Gaussian fitting was performed, as shown in the lower part of the figure.
    Fig. 5. (Color online) The top half of the figure shows the power-dependent PL spectrum of samples annealed at (a) 750, (b) 800, (c) 850, and (d) 900 °C recorded at 300 K. The PL spectrum of the annealed sample under an excitation power of 40 mW was extracted and Gaussian fitting was performed, as shown in the lower part of the figure.
    Dandan Ning, Yanan Chen, Xinkun Li, Dechun Liang, Shufang Ma, Peng Jin, Zhanguo Wang. Research on the photoluminescence of spectral broadening by rapid thermal annealing on InAs/GaAs quantum dots[J]. Journal of Semiconductors, 2020, 41(12): 122101
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