Simulation and Experimental Study of Absolute Measurement Method for Optical Surface

Shi Meng; Shijie Liu; Lei Chen; You Zhou; Yunbo Bai

doi:10.3788/LOP55.051201

Journals >Laser & Optoelectronics Progress >Volume 55 >Issue 5 >Page 051201 > Article

Laser & Optoelectronics Progress
Vol. 55, Issue 5, 051201 (2018)

Simulation and Experimental Study of Absolute Measurement Method for Optical Surface

Shi Meng^{1、2、1; 2;}, Shijie Liu^1、2;, Lei Chen^1、1;, You Zhou^1、2;, and Yunbo Bai^1、2;

Author Affiliations

¹ Key Laboratory of High Laser Materials, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

¹ School of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology, Nanjing, Jiangsu 210094, China

² Key Laboratory of High Laser Materials, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

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DOI: 10.3788/LOP55.051201 Cite this Article Set citation alerts

Shi Meng, Shijie Liu, Lei Chen, You Zhou, Yunbo Bai. Simulation and Experimental Study of Absolute Measurement Method for Optical Surface[J]. Laser & Optoelectronics Progress, 2018, 55(5): 051201 Copy Citation Text

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Shi Meng, Shijie Liu, Lei Chen, You Zhou, Yunbo Bai. Simulation and Experimental Study of Absolute Measurement Method for Optical Surface[J]. Laser & Optoelectronics Progress, 2018, 55(5): 051201

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