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Journals >Laser & Optoelectronics Progress >Volume 59 >Issue 2 >Page 0210003 > Article

Laser & Optoelectronics Progress
Vol. 59, Issue 2, 0210003 (2022)

Simultaneous Localization and Mapping Based on Point and Line Feature Matching

Yunduo Li^1、2, Jin Che^1、2、*, and Cheng Xue^1、2

Author Affiliations

¹School of Physics and Electronic-Electrical Engineering, Ningxia University, Yinchuan , Ningxia 750021, China

²Ningxia Key Laboratory of Intelligent Sensing for Desert Information, Ningxia University, Yinchuan , Ningxia 750021, China

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DOI: 10.3788/LOP202259.0210003 Cite this Article Set citation alerts

Yunduo Li, Jin Che, Cheng Xue. Simultaneous Localization and Mapping Based on Point and Line Feature Matching[J]. Laser & Optoelectronics Progress, 2022, 59(2): 0210003 Copy Citation Text

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Yunduo Li, Jin Che, Cheng Xue. Simultaneous Localization and Mapping Based on Point and Line Feature Matching[J]. Laser & Optoelectronics Progress, 2022, 59(2): 0210003

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