• Laser & Optoelectronics Progress
  • Vol. 59, Issue 2, 0210003 (2022)
Yunduo Li1、2, Jin Che1、2、*, and Cheng Xue1、2
Author Affiliations
  • 1School of Physics and Electronic-Electrical Engineering, Ningxia University, Yinchuan , Ningxia 750021, China
  • 2Ningxia Key Laboratory of Intelligent Sensing for Desert Information, Ningxia University, Yinchuan , Ningxia 750021, China
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    DOI: 10.3788/LOP202259.0210003 Cite this Article Set citation alerts
    Yunduo Li, Jin Che, Cheng Xue. Simultaneous Localization and Mapping Based on Point and Line Feature Matching[J]. Laser & Optoelectronics Progress, 2022, 59(2): 0210003 Copy Citation Text show less

    Abstract

    At present, the real-time localization technology in simultaneous localization and mapping (SLAM) algorithm has become stable, and the research field turns to the semi-dense SLAM based on point-line feature. Aiming at this research direction, a SLAM algorithm based on point-line feature is proposed. First, an oriented fast and rotated brief (ORB) algorithm based on three patches and local gray difference is used in the visual front end to extract and match feature points. Meanwhile, multiscale line segmentation detector (MLSD) algorithm is used to extract and match line segment features, so that the system adds constraint conditions of line features on the basis of point feature geometric transformation to calculate pose transformation. Then the position and orientation are optimized using point and line constraints through the local bundle adjustment (BA) method. Finally, loop closure detection is performed for repositioning. The proposed algorithm is tested on Euroc dataset and compared with similar algorithms. The experimental results show that the map is relatively dense, with clear outline and high accuracy. At the same time, the root mean square error (RMSE) in V1-02-mdeium, V2-02-mdeium, MH-02-easy, MH-03-medium, MH-04-difficult datasets is 0.045, 0.0561, 0.0539, 0.0491, 0.0623 respectively, which is relatively the lowest. The results show that the proposed algorithm has relatively good mapping effect and high accuracy among similar algorithms.
    Yunduo Li, Jin Che, Cheng Xue. Simultaneous Localization and Mapping Based on Point and Line Feature Matching[J]. Laser & Optoelectronics Progress, 2022, 59(2): 0210003
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