• Acta Optica Sinica
  • Vol. 40, Issue 15, 1523002 (2020)
Shoulong Xu1、2、*, Kuicheng Lin3, Yongchao Han4、**, Shuliang Zou1、***, Xiuwu Yu1, Qifan Wu2, Yantao Qu4, Hongtao Quan5, and Zengyan Li6
Author Affiliations
  • 1School of Resource Environment and Safety Engineering, University of South China, Hengyang, Hunan 421001, China
  • 2Department of Engineering Physics, Tsinghua University, Beijing 100084, China
  • 3Instituted of Materials, China Academy of Engineering Physics, Mianyang, Sichuan 621700, China
  • 4CNNC New Energy Company Limited, Beijing 102413, China
  • 5School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 611731, China
  • 6Northwest Institute of Nuclear Technology, Xi′an, Shaanxi 710024, China
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    DOI: 10.3788/AOS202040.1523002 Cite this Article Set citation alerts
    Shoulong Xu, Kuicheng Lin, Yongchao Han, Shuliang Zou, Xiuwu Yu, Qifan Wu, Yantao Qu, Hongtao Quan, Zengyan Li. Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera[J]. Acta Optica Sinica, 2020, 40(15): 1523002 Copy Citation Text show less
    References

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    [11] Wang Z J, Lin D S, Liu M B et al. Radiation damage effects on the CMOS active pixel sensors[J]. Semiconductor Optoelectronics, 35, 945-950(2014).

    [12] Wang Z J, Ma W Y, Huang S Y et al. Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors[J]. AIP Advances, 6, 035205(2016).

    [13] Wang Z J, Ma Y W, Liu J et al. Degradation and annealing studies on Gamma rays irradiated COTS PPD CISs at different dose rates[J]. Nuclear Instruments and Methods in Physics Research, 820, 89-94(2016).

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    [18] Xu S L, Zou S L, Huang Y J. Effect of γ-ray ionizing radiation on CMOS active pixel sensor[J]. Chinese Journal of Luminescence, 38, 308-315(2017).

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    Shoulong Xu, Kuicheng Lin, Yongchao Han, Shuliang Zou, Xiuwu Yu, Qifan Wu, Yantao Qu, Hongtao Quan, Zengyan Li. Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera[J]. Acta Optica Sinica, 2020, 40(15): 1523002
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