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Journals >
Acta Optica Sinica >
Volume 40 >
Issue 15 >
Page 1523002 > Article
Acta Optica Sinica
Vol. 40, Issue 15, 1523002 (2020)
Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera
Shoulong Xu
1、2、*
, Kuicheng Lin
3
, Yongchao Han
4、**
, Shuliang Zou
1、***
, Xiuwu Yu
1
, Qifan Wu
2
, Yantao Qu
4
, Hongtao Quan
5
, and Zengyan Li
6
Author Affiliations
1
School of Resource Environment and Safety Engineering, University of South China, Hengyang, Hunan 421001, China
2
Department of Engineering Physics, Tsinghua University, Beijing 100084, China
3
Instituted of Materials, China Academy of Engineering Physics, Mianyang, Sichuan 621700, China
4
CNNC New Energy Company Limited, Beijing 102413, China
5
School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 611731, China
6
Northwest Institute of Nuclear Technology, Xi′an, Shaanxi 710024, China
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DOI:
10.3788/AOS202040.1523002
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Shoulong Xu, Kuicheng Lin, Yongchao Han, Shuliang Zou, Xiuwu Yu, Qifan Wu, Yantao Qu, Hongtao Quan, Zengyan Li. Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera[J]. Acta Optica Sinica, 2020, 40(15): 1523002
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Shoulong Xu, Kuicheng Lin, Yongchao Han, Shuliang Zou, Xiuwu Yu, Qifan Wu, Yantao Qu, Hongtao Quan, Zengyan Li. Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera[J]. Acta Optica Sinica, 2020, 40(15): 1523002
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Paper Information
Category: Optical Devices
Received: Mar. 12, 2020
Accepted: May. 6, 2020
Published Online: Aug. 4, 2020
The Author Email: Xu Shoulong (xusl@usc.edu.cn), Han Yongchao (hanyongchao@ciae.ac.cn), Zou Shuliang (zousl2013@126.com)
DOI:
10.3788/AOS202040.1523002
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