• Opto-Electronic Advances
  • Vol. 1, Issue 6, 180011-1 (2018)
Honggang Ye1、2, Zhicheng Su1, Fei Tang1, Yitian Bao1, Xiangzhou Lao1, Guangde Chen2, Jian Wang1, and Shijie Xu1、*
Author Affiliations
  • 1Department of Physics, and Shenzhen Institute of Research and Innovation (HKU-SIRI), The University of Hong Kong, Pokfulam Road, Hong Kong, China
  • 2Department of Applied Physics, Xi'an Jiaotong University, Xi'an 710049, China
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    DOI: 10.29026/oea.2018.180011 Cite this Article
    Honggang Ye, Zhicheng Su, Fei Tang, Yitian Bao, Xiangzhou Lao, Guangde Chen, Jian Wang, Shijie Xu. Probing defects in ZnO by persistent phosphorescence[J]. Opto-Electronic Advances, 2018, 1(6): 180011-1 Copy Citation Text show less
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    Honggang Ye, Zhicheng Su, Fei Tang, Yitian Bao, Xiangzhou Lao, Guangde Chen, Jian Wang, Shijie Xu. Probing defects in ZnO by persistent phosphorescence[J]. Opto-Electronic Advances, 2018, 1(6): 180011-1
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