Ping Wu, Yunsheng Jiang, Zhiqian Xu, Liuhong Huang, Cui Meng. Experimental Research on CCD Imaging Equipment in Intensive Electromagnetic-Pulse Environment[J]. Acta Optica Sinica, 2019, 39(6): 0611002
- Acta Optica Sinica
- Vol. 39, Issue 6, 0611002 (2019)
Fig. 1. Typical function module of CCD imaging equipment
Fig. 2. Experimental setups of high-power microwave and double-exponential NEMP. (a) Experimental setup of high-power microwave; (b) experimental setup of double-exponential NEMP under exposure of whole system ; (c) experimental setup of double-exponential NEMP under isolated exposure of CCD camera
Fig. 3. Flow chart of effect probability-threshold test
Fig. 4. Comparison of two kinds of failure-probability
Fig. 5. (a) Schematic of single-frame image and (b) relative grayscale value curve of single-row pixels at incident of EMP
Fig. 6. Diagrams of (a) single-frame luminance distortion and (b) one-rank dimension compression
Fig. 7. Grayscale plot in time domain after two-rank dimension compression
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Table 1. Test equipment parameters of intensive electromagnetic field
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