Intensive electromagnetic pulses are common in high-power laser and X-ray equipment and in various environments, such as future battlefields. This kind of harsh environmental factor can affect electronic equipment, especially optical-imaging devices that cannot be shielded well while performing specific imaging tasks. Herein, we choose a digital camera and discrete charge coupled device (CCD) camera system as typical devices used for testing. We investigate the effects on optical-imaging device when the device is subjected to an intensive electromagnetic environment. We observe such effects as equipment malfunctions, decline in imaging quality, and module destruction. Herein, the observed effects and relevant electromagnetic environment data are summarized and analyzed. We promote the idea of using failure-probability thresholds under certain environmental conditions to measure the equipment viability. We provide the probability threshold curve for the CCD imaging system. Finally, we discuss the experimental method to investigate the electromagnetic effects. This work can provide supporting data and referable experience for others’ evaluation and protection of equipment subjected to intensive electromagnetic environment.