• Infrared and Laser Engineering
  • Vol. 51, Issue 2, 20210890 (2022)
Tao He1, Zhonghua Shen1, Fei Chen1, and Li Chen2
Author Affiliations
  • 1School of Science, Nanjing University of Science and Technology, Nanjing 210014, China
  • 2School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China
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    DOI: 10.3788/IRLA20210890 Cite this Article
    Tao He, Zhonghua Shen, Fei Chen, Li Chen. Measurement of translucent coating thickness based on pulsed thermography[J]. Infrared and Laser Engineering, 2022, 51(2): 20210890 Copy Citation Text show less
    References

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    [16] R Shrestha, W Kim. Evaluation of coating thickness by thermal wave imaging: A comparative study of pulsed and lock-in infrared thermography - Part I: Simulation. Infrared Physics & Technology, 83, 124-131(2017).

    [17] R Shrestha, W Kim. Evaluation of coating thickness by thermal wave imaging: A comparative study of pulsed and lock-in infrared thermography – Part II: Experimental investigation. Infrared Physics & Technology, 92, 24-29(2018).

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    Tao He, Zhonghua Shen, Fei Chen, Li Chen. Measurement of translucent coating thickness based on pulsed thermography[J]. Infrared and Laser Engineering, 2022, 51(2): 20210890
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