• Acta Optica Sinica
  • Vol. 19, Issue 11, 1518 (1999)
[in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article Set citation alerts
    [in Chinese], [in Chinese], [in Chinese]. Nonlinear Excess Fraction Method and its Applications to Profilometry[J]. Acta Optica Sinica, 1999, 19(11): 1518 Copy Citation Text show less
    References

    [2] Judge T R, Bryanston-Cross P J. A review of phase unwrapping techniques in fringe analysis. Opt. Lasers Engng., 1994, 21(4):199~239

    [3] Saldner H O, Huntley J M. Profilometry using temporal phase unwrapping and a spatial light modulator-based fringe projector. Opt. Engng., 1997, 36(2):610~615

    [4] Sansoni G, Biancardi L, Minoni U et al.. A novel, adaptive system for 3-D optical profilometry using a liquid crystal light projector. IEEE Trans. Instrum. Meas., 1994, 43(4):558~565

    [6] Li J L, Su H J, Su X Y. Two-frequency grating used in phase-measuring profilometry. Appl. Opt., 1997, 36(1):277~280

    [7] Xie X, Atkinson J T, Lalor M J et al.. Three map absolute moiré contouring. Appl. Opt., 1996, 35(35):6990~6995

    [8] Nadeborn W, Andr P, Osten W. A robust procedure for absolute phase measurement. Opt. Lasers Engng., 1995, 24(2-3):245~260

    [9] Hariharan P, Oreb B F, Eiju T. Digital phase-shifting interferometry: a simple error compensating phase calculation algorithm. Appl. Opt., 1987, 26(13):2504~2506

    CLP Journals

    [1] Shao Shuangyun, Xu Nan. Optical Three-dimensional Profilometry Based on Modulation Ratio[J]. Chinese Journal of Lasers, 2009, 36(2): 435

    [2] Dou Yunfu, Su Xianyu, Chen Yanfei. A Fast Modulation Measurement Profilometry[J]. Acta Optica Sinica, 2009, 29(7): 1858

    [3] Zhang Haihua, Li Yong, Lu Shijiang, Chen Liangfeng. Subpixel Matching of Three-Dimansional Imaging System Using Binary Spatiotemporal Encoded Illumination[J]. Chinese Journal of Lasers, 2011, 38(10): 1008006

    [4] Li Yong, Chen Yunfu, Jin Hongzhen, Wang Hui. Binary Spatio-Temporal Encoded Illumination for 3D Imaging[J]. Acta Optica Sinica, 2009, 29(3): 670

    [5] HAO Yi-ming, SU Xian-yu, ZHAO Yong, XIANG Li-qun. A New Method for the Binary Code Design and the Absolute Photoelectric Position Measurement[J]. Opto-Electronic Engineering, 2010, 37(11): 91

    [6] Lu Mingteng, Su Xianyu, Cao Yiping, You Zhisheng, Jing Hailong. A Method of Both Height Mapping and Camera Calibration at the Same Time in Modulation Measuring Profilometry[J]. Acta Optica Sinica, 2016, 36(6): 612002

    [in Chinese], [in Chinese], [in Chinese]. Nonlinear Excess Fraction Method and its Applications to Profilometry[J]. Acta Optica Sinica, 1999, 19(11): 1518
    Download Citation