• Acta Optica Sinica
  • Vol. 19, Issue 11, 1518 (1999)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Nonlinear Excess Fraction Method and its Applications to Profilometry[J]. Acta Optica Sinica, 1999, 19(11): 1518 Copy Citation Text show less

    Abstract

    The difficulty in phase unwrapping is the key problem that compromises reliability and prevents automatic measurement in grating projection profilometry. A novel temporal phase unwrapping algorithmnon-linear excess fraction method (NLEFM) is proposed, which may extend the reliable measuring range by a factor of dozens without losing accuracy. The principle of NLEFM is detailed and experimental results are given in which complex profiles are reliably computed using this algorithm
    [in Chinese], [in Chinese], [in Chinese]. Nonlinear Excess Fraction Method and its Applications to Profilometry[J]. Acta Optica Sinica, 1999, 19(11): 1518
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