One-Plane Two-Hole Feature Positioning Method Based on Line Laser On-Machine Measurement

Zhou Yanfeng; Chen Weifang; Cao Xinhang; Pan Lijian

doi:10.3788/LOP202158.0112004

Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 1 >Page 112004 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 1, 112004 (2021)

One-Plane Two-Hole Feature Positioning Method Based on Line Laser On-Machine Measurement

Zhou Yanfeng, Chen Weifang^*, Cao Xinhang, and Pan Lijian

Author Affiliations

College of Mechanical & Electrical Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210001, China

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DOI: 10.3788/LOP202158.0112004 Cite this Article Set citation alerts

Zhou Yanfeng, Chen Weifang, Cao Xinhang, Pan Lijian. One-Plane Two-Hole Feature Positioning Method Based on Line Laser On-Machine Measurement[J]. Laser & Optoelectronics Progress, 2021, 58(1): 112004 Copy Citation Text

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Zhou Yanfeng, Chen Weifang, Cao Xinhang, Pan Lijian. One-Plane Two-Hole Feature Positioning Method Based on Line Laser On-Machine Measurement[J]. Laser & Optoelectronics Progress, 2021, 58(1): 112004

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