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    Journals >Journal of Infrared and Millimeter Waves >Volume 20 >Issue 5 >Page 353 > Article
    • Journal of Infrared and Millimeter Waves
    • Vol. 20, Issue 5, 353 (2001)
    A METHOD FOR CHARACTERIZING EFFECTIVE INTENSITY OF FRANZ-KELDYSH EFFECT IN (HgCd)Te DETECTORS
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A METHOD FOR CHARACTERIZING EFFECTIVE INTENSITY OF FRANZ-KELDYSH EFFECT IN (HgCd)Te DETECTORS[J]. Journal of Infrared and Millimeter Waves, 2001, 20(5): 353 Copy Citation Text show less
    References

    [1] Hunsperger. Integrated Optics: Theory and Technology, 2nd ed.New York: Springer-Verlag, 1984,Ch.15: 261-262

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A METHOD FOR CHARACTERIZING EFFECTIVE INTENSITY OF FRANZ-KELDYSH EFFECT IN (HgCd)Te DETECTORS[J]. Journal of Infrared and Millimeter Waves, 2001, 20(5): 353
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