A METHOD FOR CHARACTERIZING EFFECTIVE INTENSITY OF FRANZ-KELDYSH EFFECT IN (HgCd)Te DETECTORS

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Journal of Infrared and Millimeter Waves >Volume 20 >Issue 5 >Page 353 > Article

Journal of Infrared and Millimeter Waves
Vol. 20, Issue 5, 353 (2001)

A METHOD FOR CHARACTERIZING EFFECTIVE INTENSITY OF FRANZ-KELDYSH EFFECT IN (HgCd)Te DETECTORS

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

Author Affiliations

[in Chinese]

show less

DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A METHOD FOR CHARACTERIZING EFFECTIVE INTENSITY OF FRANZ-KELDYSH EFFECT IN (HgCd)Te DETECTORS[J]. Journal of Infrared and Millimeter Waves, 2001, 20(5): 353 Copy Citation Text

show less

Abstract

A simple method for characterizing effective intensity of Franz Keldysh effect of (HgCd)Te detectors was presented.It is using the output ratio of different bias voltage instead of wavelength shift to characterize effective intensity of Franz Keldysh effect. The experimental result shows this method is effective and practical.

Keywords

CO2laser.Franz Keldysh effect (HgCd）Te detectros

Download Citation

Save the article for my favorites

Paper Information