• Acta Optica Sinica
  • Vol. 41, Issue 7, 0731001 (2021)
Boyang Wei1、*, Dongmei Liu1, Xiuhua Fu1, Jing Zhang1, Yang Wang2, and Yu Geng2
Author Affiliations
  • 1School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun, Jilin 130022, China
  • 2Optorun (Shanghai) Co., Ltd., Shanghai 200444, China
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    DOI: 10.3788/AOS202141.0731001 Cite this Article Set citation alerts
    Boyang Wei, Dongmei Liu, Xiuhua Fu, Jing Zhang, Yang Wang, Yu Geng. Study on Film Thickness Uniformity of Magnetron Sputtering System Based on Twin Target[J]. Acta Optica Sinica, 2021, 41(7): 0731001 Copy Citation Text show less
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    Boyang Wei, Dongmei Liu, Xiuhua Fu, Jing Zhang, Yang Wang, Yu Geng. Study on Film Thickness Uniformity of Magnetron Sputtering System Based on Twin Target[J]. Acta Optica Sinica, 2021, 41(7): 0731001
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