Absorption measurement of optical thin films under high power density with a Closed Cavity

Xiaoting Fang; Shengfu Yuan; Wenguang Liu; Baozhu Yan; Bing Huang

doi:10.3788/COL201513.033101

Journals >Chinese Optics Letters >Volume 13 >Issue 3 >Page 033101 > Article

Chinese Optics Letters
Vol. 13, Issue 3, 033101 (2015)

Absorption measurement of optical thin films under high power density with a Closed Cavity

Xiaoting Fang, Shengfu Yuan^*, Wenguang Liu, Baozhu Yan, and Bing Huang

Author Affiliations

College of Optoelectric Science and Engineering, National University of Defence Technology, Changsha 410073, China

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DOI: 10.3788/COL201513.033101 Cite this Article Set citation alerts

Xiaoting Fang, Shengfu Yuan, Wenguang Liu, Baozhu Yan, Bing Huang. Absorption measurement of optical thin films under high power density with a Closed Cavity[J]. Chinese Optics Letters, 2015, 13(3): 033101 Copy Citation Text

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