Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Acta Optica Sinica >Volume 41 >Issue 1 >Page 0112001 > Article
    • Acta Optica Sinica
    • Vol. 41, Issue 1, 0112001 (2021)
    Progress and Prospect of Optical Freeform Surface Measurement
    Rihong Zhu1、2、*, Yue Sun1、2, and Hua Shen1、2、**
    Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, Jiangsu 210094, China
  • 2MIIT Key Laboratory of Advanced Solid Laser, Nanjing University of Science and Technology, Nanjing, Jiangsu 210094, China
    • show less
    DOI: 10.3788/AOS202141.0112001 Cite this Article Set citation alerts
    Rihong Zhu, Yue Sun, Hua Shen. Progress and Prospect of Optical Freeform Surface Measurement[J]. Acta Optica Sinica, 2021, 41(1): 0112001 Copy Citation Text show less
    Typical applications of optical freeform surfaces. (a) AR head-mounted display[7]; (b) off-axis three-mirror system with ultra-wide field of view[20]
    Fig. 1. Typical applications of optical freeform surfaces. (a) AR head-mounted display[7]; (b) off-axis three-mirror system with ultra-wide field of view[20]
    Download full size
    ZEISS XENOS commercial CMM system[23]
    Fig. 2. ZEISS XENOS commercial CMM system[23]
    Download full size
    Taylor Hopson's commercial profilometers. (a) PGI Freeform profilometer[27]; (b) LuphoScan profilometer[29]
    Fig. 3. Taylor Hopson's commercial profilometers. (a) PGI Freeform profilometer[27]; (b) LuphoScan profilometer[29]
    Download full size
    Schematic of optical surface measurement with SOC[35]. (a) Measurement principle of SOC; (b) scanning path of SOC
    Fig. 4. Schematic of optical surface measurement with SOC[35]. (a) Measurement principle of SOC; (b) scanning path of SOC
    Download full size
    Schematic of Shark-Hartman wavefront detection[44]
    Fig. 5. Schematic of Shark-Hartman wavefront detection[44]
    Download full size
    Schematic of structured light 3D measurement[47]
    Fig. 6. Schematic of structured light 3D measurement[47]
    Download full size
    Measurement principle of CGH method[70]
    Fig. 7. Measurement principle of CGH method[70]
    Download full size
    Layout of partial-null compensating interferometric system[92]
    Fig. 8. Layout of partial-null compensating interferometric system[92]
    Download full size
    Test principle of Zernike freeform surface in Rochester University[86]
    Fig. 9. Test principle of Zernike freeform surface in Rochester University[86]
    Download full size
    Principle of MANI system[88]
    Fig. 10. Principle of MANI system[88]
    Download full size
    Schematic of flexible aberration generator used for compensating freeform surface in Anhui University[91]
    Fig. 11. Schematic of flexible aberration generator used for compensating freeform surface in Anhui University[91]
    Download full size
    Test principle of ASSI[106]
    Fig. 12. Test principle of ASSI[106]
    Download full size
    Measurement principle of CSSI[110]. (a) Schematic of CSSI system; (b) schematic of circular aperture partition
    Fig. 13. Measurement principle of CSSI[110]. (a) Schematic of CSSI system; (b) schematic of circular aperture partition
    Download full size
    Irregular sub-aperture partition of interferograms[119]. (a)(d) Interferograms of biconic surface; (b)(e) resolvable sub-apertures; (c)(f) trimmed sub-apertures of Fig.14(b), (e); (g) ultimate result of sub-aperture partition
    Fig. 14. Irregular sub-aperture partition of interferograms[119]. (a)(d) Interferograms of biconic surface; (b)(e) resolvable sub-apertures; (c)(f) trimmed sub-apertures of Fig.14(b), (e); (g) ultimate result of sub-aperture partition
    Download full size
    Measurement principle of TWI[121]. (a) Optical path layout; (b) interferogram array
    Fig. 15. Measurement principle of TWI[121]. (a) Optical path layout; (b) interferogram array
    Download full size
    Measurement principle of TWI based on tip/tilt mirror[137]. (a) Optical path layout; (b) interferograms under different angles of tip/tilt mirror
    Fig. 16. Measurement principle of TWI based on tip/tilt mirror[137]. (a) Optical path layout; (b) interferograms under different angles of tip/tilt mirror
    Download full size
    Layout of common-path TWI system[138]
    Fig. 17. Layout of common-path TWI system[138]
    Download full size
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (17)
    Equations (0)
    References (139)
    Get Citation
    Copy Citation Text
    Rihong Zhu, Yue Sun, Hua Shen. Progress and Prospect of Optical Freeform Surface Measurement[J]. Acta Optica Sinica, 2021, 41(1): 0112001
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology