• Laser & Optoelectronics Progress
  • Vol. 59, Issue 19, 1912002 (2022)
Xiaobo Cheng1、2, Yundong Zhu1、2、*, Xuezhu Lin1、2, Funing Liu1、2, and Linxin Yin1、2
Author Affiliations
  • 1School of Optoelectronic Engineering, Changchun University of Science and Technology,Changchun 130022, Jilin, China
  • 2National Demonstration Center for Experimental Opto-Electronic Engineering Education, School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun 130022, Jilin, China
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    DOI: 10.3788/LOP202259.1912002 Cite this Article Set citation alerts
    Xiaobo Cheng, Yundong Zhu, Xuezhu Lin, Funing Liu, Linxin Yin. Recurrence of Laplace Deformation Surface Based on Optimized Control Point Monitoring[J]. Laser & Optoelectronics Progress, 2022, 59(19): 1912002 Copy Citation Text show less

    Abstract

    This study proposes a method for Laplace surface recurrence based on optimized control point monitoring to tackle the challenges of high-intensity and time-consuming of surface deformation detection engineering processing in the assembly process. First, the model is simplified based on various constraints, control points are placed, and spacing is optimized using a qualitative analysis of the simplified model’s deflection. Second, by mapping the source model with the centroid as the reference point and determining the corresponding control point coordinates on the source model, the relationship between the source model and the real deformation component is established. On this basis, the surface is subjected to Laplace deformation to ensure that the reconstructed surface can reflect the real deformed component. The experimental results show that the reconstruction accuracy of 93% can be controlled within 0.1 mm, reflecting the actual deformation of components. This study is significant in terms of engineering guidance in practical application.
    Xiaobo Cheng, Yundong Zhu, Xuezhu Lin, Funing Liu, Linxin Yin. Recurrence of Laplace Deformation Surface Based on Optimized Control Point Monitoring[J]. Laser & Optoelectronics Progress, 2022, 59(19): 1912002
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