Layer-number determination of two-dimensional materials by optical characterization

You Zheng; Changyong Lan; Zhifei Zhou; Xiaoying Hu; Tianying He; Chun Li

doi:10.3788/COL201816.020006

Journals >Chinese Optics Letters >Volume 16 >Issue 2 >Page 020006 > Article

Chinese Optics Letters
Vol. 16, Issue 2, 020006 (2018)

Layer-number determination of two-dimensional materials by optical characterization

You Zheng, Changyong Lan, Zhifei Zhou, Xiaoying Hu, Tianying He, and Chun Li^*

Author Affiliations

State Key Laboratory of Electronic Thin Films and Integrated Devices, and School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China

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DOI: 10.3788/COL201816.020006 Cite this Article Set citation alerts

You Zheng, Changyong Lan, Zhifei Zhou, Xiaoying Hu, Tianying He, Chun Li. Layer-number determination of two-dimensional materials by optical characterization[J]. Chinese Optics Letters, 2018, 16(2): 020006 Copy Citation Text

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