• Journal of Semiconductors
  • Vol. 40, Issue 11, 111606 (2019)
Shuo Li1, Xiao Feng1, Hao Liu1, Kai Wang1, Yun-Ze Long2, and S. Ramakrishna3
Author Affiliations
  • 1College of Electrical Engineering, Qingdao University, Qingdao 266071, China
  • 2Collaborative Innovation Center for Nanomaterials and Devices, College of Physics, Qingdao University, Qingdao 266071, China
  • 3NUS Centre for Nanofibers and Nanotechnology, Department of Mechanical Engineering, National University of Singapore, Singapore
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    DOI: 10.1088/1674-4926/40/11/111606 Cite this Article
    Shuo Li, Xiao Feng, Hao Liu, Kai Wang, Yun-Ze Long, S. Ramakrishna. Preparation and application of carbon nanotubes flexible sensors[J]. Journal of Semiconductors, 2019, 40(11): 111606 Copy Citation Text show less
    Structure characterization of the CNFs. (a) Image of the CNFs under the SEM. (b) Image of the CNFs under the TEM. (Reproduced with permission from Ref. [15].)
    Fig. 1. Structure characterization of the CNFs. (a) Image of the CNFs under the SEM. (b) Image of the CNFs under the TEM. (Reproduced with permission from Ref. [15].)
    Structure characterization of the CNSs. (a) Image of the CNSs under the SEM. (b) Image of the CNSs under the TEM. (Reproduced with permission from Ref. [18].)
    Fig. 2. Structure characterization of the CNSs. (a) Image of the CNSs under the SEM. (b) Image of the CNSs under the TEM. (Reproduced with permission from Ref. [18].)
    Theory model of the CNTs.
    Fig. 3. Theory model of the CNTs.
    Structure characterization of the CNTs. (Reproduced with permission from Ref. [29].)
    Fig. 4. Structure characterization of the CNTs. (Reproduced with permission from Ref. [29].)
    Raman spectra of pristine (thin solid), I2-intercalated (thick solid), and deintercalated (dashed) SWNTs in the low Raman shift range taken by: (a) the 514.5-nm line of an Ar-ion laser and by (b) the 647.1-nm line of Kr-ion laser. (Reproduced with permission from Ref. [33].)
    Fig. 5. Raman spectra of pristine (thin solid), I2-intercalated (thick solid), and deintercalated (dashed) SWNTs in the low Raman shift range taken by: (a) the 514.5-nm line of an Ar-ion laser and by (b) the 647.1-nm line of Kr-ion laser. (Reproduced with permission from Ref. [33].)
    (Color online) UV–vis spectroscopy of SWCNT-3 with 9 anthracene carboxylic acid in DI water. (Reproduced with permission from Ref. [34].)
    Fig. 6. (Color online) UV–vis spectroscopy of SWCNT-3 with 9 anthracene carboxylic acid in DI water. (Reproduced with permission from Ref. [34].)
    (Color online) Fabrication steps of the RG/PDMS composite flexible sensor. (Reproduced with permission from Ref. [35].)
    Fig. 7. (Color online) Fabrication steps of the RG/PDMS composite flexible sensor. (Reproduced with permission from Ref. [35].)
    Schematic of the process of CVD method of preparing the GF/PDMS strain sensors. (Reproduced with permission from Ref. [36].)
    Fig. 8. Schematic of the process of CVD method of preparing the GF/PDMS strain sensors. (Reproduced with permission from Ref. [36].)
    (Color online) (a) Respective cyclic voltammograms of TiO2 nanotube supercapacitor, PEDOT–MWNT film supercapacitor and TiO2 nanotube + PEDOT–MWNT film supercapacitor in 1 M H2SO4 aqueous electrolyte. (b) Nyquist plots of TiO2 nanotube supercapacitor, PEDOT–MWNT film supercapacitor, and TiO2 nanotube + PEDOT–MWNT film supercapacitor from high frequency to low frequency. (Reproduced with permission from Ref. [8].)
    Fig. 9. (Color online) (a) Respective cyclic voltammograms of TiO2 nanotube supercapacitor, PEDOT–MWNT film supercapacitor and TiO2 nanotube + PEDOT–MWNT film supercapacitor in 1 M H2SO4 aqueous electrolyte. (b) Nyquist plots of TiO2 nanotube supercapacitor, PEDOT–MWNT film supercapacitor, and TiO2 nanotube + PEDOT–MWNT film supercapacitor from high frequency to low frequency. (Reproduced with permission from Ref. [8].)
    (Color online) Temperature dependence of resistivity of several materials. (Reproduced with permission from Ref. [37].)
    Fig. 10. (Color online) Temperature dependence of resistivity of several materials. (Reproduced with permission from Ref. [37].)
    (Color online) (a) The values of contact resistance. (b) Characteristics of drain current versus gate voltage of transistors with a P3HT or F-SWCNT-P3HT channel and gold or MWCNT S/Ds. (Reproduced with permission from Ref. [38].)
    Fig. 11. (Color online) (a) The values of contact resistance. (b) Characteristics of drain current versus gate voltage of transistors with a P3HT or F-SWCNT-P3HT channel and gold or MWCNT S/Ds. (Reproduced with permission from Ref. [38].)
    (Color online) Resistance evolution of resulting structures as a function of gas concentrations. (a) CO. (b) CO2. (c) NH3. (Reproduced with permission from Ref. [39].)
    Fig. 12. (Color online) Resistance evolution of resulting structures as a function of gas concentrations. (a) CO. (b) CO2. (c) NH3. (Reproduced with permission from Ref. [39].)
    (Color online) Two-dimensional circuit model for ballistic CNTFET. (Reproduced with permission from Ref. [40].)
    Fig. 13. (Color online) Two-dimensional circuit model for ballistic CNTFET. (Reproduced with permission from Ref. [40].)
    (Color online) Drain-source current diagram versus dielectric constant. (Reproduced with permission from Ref. [40].)
    Fig. 14. (Color online) Drain-source current diagram versus dielectric constant. (Reproduced with permission from Ref. [40].)
    (Color online) Transport features. (a) Sulfur Dioxide. (b) Acetonitrile. (c) Sarin Gas. (d) Carbonyl Chloride at logarithmic scale for VDS = 0.2, 0.4 V. (Reproduced with permission from Ref. [40].)
    Fig. 15. (Color online) Transport features. (a) Sulfur Dioxide. (b) Acetonitrile. (c) Sarin Gas. (d) Carbonyl Chloride at logarithmic scale for VDS = 0.2, 0.4 V. (Reproduced with permission from Ref. [40].)
    (Color online) (a) and (c) Reflection losses of raw CNTs and Ni with 2−5 mm thickness. (b) and (d) Complex permittivity ε and permeability μ of the raw CNTs and Ni. (Reproduced with permission from Ref. [41].)
    Fig. 16. (Color online) (a) and (c) Reflection losses of raw CNTs and Ni with 2−5 mm thickness. (b) and (d) Complex permittivity ε and permeability μ of the raw CNTs and Ni. (Reproduced with permission from Ref. [41].)
    EquipmentSpecification
    Copper mesh8 cm of length
    3 cm of width
    80 of mesh number
    50 μm of copper diameter
    Hydrochloric acid/acetone solution1/5 of volume ratio of hydrochloric acid/acetone
    Mixed solution of PDMS30/10/1 of mass ratio of n-hexane/PDMS monomer/curing agent
    FeCl3/HCl solution 0.5 mol/L of amount of the substance of FeCl3
    0.5 mol/L of amount of the substance of HCl
    Table 1. Several equipment and specification in the hydrothermal auxiliary method.
    EquipmentSpecification
    Nickel foam template2 × 2 cm2 of size
    Glass slide3 × 20 mm2 of size of the rectangular shape
    FGF/isopropyl alcohol (IPA) solution4.9 mg/ml of the concentration
    Galinstan eutectic alloy68.5%/21.5%/10% of atomic percentage of Ga/In/Sn
    Table 2. Several equipment and specification in the method of CVD.
    AspectHydrothermal auxiliary methodCVD method
    Time (h)1226
    Steps number137
    Equipment number1414
    Complexity degreeNormalHard
    Reference3536
    Table 3. Comparison between hydrothermal auxiliary method and CVD method.
    Shuo Li, Xiao Feng, Hao Liu, Kai Wang, Yun-Ze Long, S. Ramakrishna. Preparation and application of carbon nanotubes flexible sensors[J]. Journal of Semiconductors, 2019, 40(11): 111606
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