• Journal of Semiconductors
  • Vol. 40, Issue 12, 122902 (2019)
Chaohui Li1, Jun Deng1, Weiye Sun1, Leilei He1, Jianjun Li1, Jun Han1, and Yanli Shi2
Author Affiliations
  • 1Key Laboratory of Optoelectronics Technology, Faculty of Information Technology, Beijing University of Technology, Beijing 100124, China
  • 2School of Physics & Astronomy, Yunnan University, Kunming 650091, China
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    DOI: 10.1088/1674-4926/40/12/122902 Cite this Article
    Chaohui Li, Jun Deng, Weiye Sun, Leilei He, Jianjun Li, Jun Han, Yanli Shi. Improvement of tunnel compensated quantum well infrared detector[J]. Journal of Semiconductors, 2019, 40(12): 122902 Copy Citation Text show less
    Schematic diagram of the multi-quantum well infrared detector with tunnel compensation structure[14] (under the reverse bias).
    Fig. 1. Schematic diagram of the multi-quantum well infrared detector with tunnel compensation structure[14] (under the reverse bias).
    The relationship between ND and depletion layer width (NA = 2 × 1019 cm–3).
    Fig. 2. The relationship between ND and depletion layer width (NA = 2 × 1019 cm–3).
    The relationship between Lw and sub-levels. E1 is the first level, E2 is the second level and Eb is the barrier height.
    Fig. 3. The relationship between Lw and sub-levels. E1 is the first level, E2 is the second level and Eb is the barrier height.
    Schematic diagram of the improved structure under the reverse bias.
    Fig. 4. Schematic diagram of the improved structure under the reverse bias.
    The relationship between the gain and wavelength of different numbers of wells: (a) single well, (b) double well and (c) triple well.
    Fig. 5. The relationship between the gain and wavelength of different numbers of wells: (a) single well, (b) double well and (c) triple well.
    Response spectrum of sample at 77 K.
    Fig. 6. Response spectrum of sample at 77 K.
    Dark current versus applied bias of sample at 77 K. (a) Forward bias. (b) Reverse bias.
    Fig. 7. Dark current versus applied bias of sample at 77 K. (a) Forward bias. (b) Reverse bias.
    Blackbody response test of sample at 77 K.
    Fig. 8. Blackbody response test of sample at 77 K.
    MaterialThickness (nm)
    P+-GaAs 300
    2 cyclesP+-GaAs 12
    N+-GaAs 24
    20 cycles i-AlxGa1–xAs x = 0.28 6
    N+-GaAs 6
    i-AlxGa1–xAs x = 0.27 40
    N+-GaAs 500
    Semi-insulating GaAs (100) substrate
    Table 1. Structural parameters of the experimental sample.
    Chaohui Li, Jun Deng, Weiye Sun, Leilei He, Jianjun Li, Jun Han, Yanli Shi. Improvement of tunnel compensated quantum well infrared detector[J]. Journal of Semiconductors, 2019, 40(12): 122902
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