[7] Garcia A M, Cordero R, Rayas J A. Two-wavelength electronic speckle-pattern interferometry for simultaneous measurement of two in-plane displacement fields[C]. Latin America Optics and Photonics Conference, LM1A, 3(2014).
[16] Butler S C, Ricci M A, Wang C et al. Homodyne displacement measuring interferometer probe for optical coordinate measuring machine with tip and tilt sensitivity[C]. Proceedings of SPIE, 9633, 96332E(2015).