Researching | Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments

Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 12 >Page 121203 > Article

Laser & Optoelectronics Progress
Vol. 56, Issue 12, 121203 (2019)

Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments

Tingting Liu¹, Peiguang Wang^1、*, and Na Zhang²

Author Affiliations

¹ College of Electronic Information Engineering, Hebei University, Baoding, Hebei 0 71002, China

² College of Physical Science and Technology, Hebei University, Baoding, Hebei 0 71002, China

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DOI: 10.3788/LOP56.121203 Cite this Article Set citation alerts

Tingting Liu, Peiguang Wang, Na Zhang. Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121203 Copy Citation Text

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References

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[11] Wang L, Zou L, Zhao S M. Edge detection based on subpixel-speckle-shifting ghost imaging[J]. Optics Communications, 407, 181-185(2018). http://adsabs.harvard.edu/abs/2018OptCo.407..181W

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[19] Lyvers E P, Mitchell O R, Akey M L et al. Subpixel measurements using a moment-based edge operator[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 11, 1293-1309(1989). http://doi.ieeecomputersociety.org/10.1109/34.41367

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Tingting Liu, Peiguang Wang, Na Zhang. Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121203

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