Researching | Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments

Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 12 >Page 121203 > Article

Laser & Optoelectronics Progress
Vol. 56, Issue 12, 121203 (2019)

Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments

Tingting Liu¹, Peiguang Wang^1、*, and Na Zhang²

Author Affiliations

¹ College of Electronic Information Engineering, Hebei University, Baoding, Hebei 0 71002, China

² College of Physical Science and Technology, Hebei University, Baoding, Hebei 0 71002, China

show less

DOI: 10.3788/LOP56.121203 Cite this Article Set citation alerts

Tingting Liu, Peiguang Wang, Na Zhang. Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121203 Copy Citation Text

show less

Cited By

Article index updated: May. 29, 2024

Citation counts are provided from Researching.

The article is cited by 4 article(s) from Researching.

Get PDF(in Chinese)

Figures&Tables (10)

References (23)

Copy Citation Text

Tingting Liu, Peiguang Wang, Na Zhang. Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121203

Download Citation

Set citation alerts for the article

Set citation alerts for the article

Save the article for my favorites

Paper Information

Recommended Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology

Set citation alerts for the article

Please enter your email address