Tingting Liu, Peiguang Wang, Na Zhang. Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121203
- Laser & Optoelectronics Progress
- Vol. 56, Issue 12, 121203 (2019)
Fig. 1. Schematic of overall hardware device in detection system
Fig. 2. Overall flow chart of defect detection of workpieces
Fig. 3. Schematic of progressive image denoising algorithm based on BM3D
Fig. 4. Schematic of image preprocessing algorithm of highly reflective workpiece
Fig. 5. Variation of edge pixels of image. (a) Original image; (b) edge pixels of local gray image; (c) 3D image
Fig. 6. Subpixel edge extraction based on Zernike moment. (a) Original edge position; (b) edge position after rotation; (c) generated template image
Fig. 7. Pixel contour lines of edge positioning error
Fig. 8. Experimental results. (a) Original images; (b) algorithm in Ref. [21]; (c) algorithm in Ref. [22]; (d) proposed algorithm
Fig. 9. Comparative experimental results under different illumination. (a) Workpiece images under different illumination; (b) results of algorithm in Ref. [21]; (c) results of algorithm in Ref. [22]; (d) results of proposed algorithm
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Table 1. Quantitative comparison of three algorithms
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