• Infrared and Laser Engineering
  • Vol. 51, Issue 3, 20210226 (2022)
Pingping Yao1、2, Bihai Tu1、2, Zhengyu Zou1、2, Zhilong Xu1、2, Aiwen Zhang1、2, Liang Sun1、2、*, Donggen Luo1、2, and Jin Hong1、2
Author Affiliations
  • 1Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China
  • 2Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China
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    DOI: 10.3788/IRLA20210226 Cite this Article
    Pingping Yao, Bihai Tu, Zhengyu Zou, Zhilong Xu, Aiwen Zhang, Liang Sun, Donggen Luo, Jin Hong. Single event latch-up and damage mechanism of analog front-end for satellite-borne polarization camera[J]. Infrared and Laser Engineering, 2022, 51(3): 20210226 Copy Citation Text show less
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    [22] Xiaoliang Li, Bo Mei, Pengwei Li, et al. Experimental study of single event latch-up of SRAM device under high temperatures. Spacecraft Environment Engineering, 36, 589-593(2019).

    Pingping Yao, Bihai Tu, Zhengyu Zou, Zhilong Xu, Aiwen Zhang, Liang Sun, Donggen Luo, Jin Hong. Single event latch-up and damage mechanism of analog front-end for satellite-borne polarization camera[J]. Infrared and Laser Engineering, 2022, 51(3): 20210226
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