Single event latch-up (SEL) effect is one of the major factors that induce the failure of space-borne remote sensing instrument. To clarify the mechanism associated with the deterioration of polarization remote sensing camera induced by space high-energy particle radiation environments, the experiments were performed on the analog front-end signal processor of the directional polarization camera with heavy-ion and pulsed laser, for the purpose of identifying the single event effects sensitivity and providing technical guarantee for engineering design and test evaluation. The experimental results indicate that the analog front-end signal processor is susceptible to the SEL effect induced by heavy-ion, the linear energy transfer (LET) threshold is around 4.4-13.4 MeV·cm²·mg^-1. Aiming at the low LET threshold, a design method of high power anti-latch up current limiting resistors in series to the analog and digital power supply terminal and the timing power on and off scheme was proposed. The results reveal that this method can effectively avoid the over-current burnout of the device and instrument failure caused by SEL. These research results provide significant reference data for the radiation-proofing design of analog front-end signal processor for the satellite-borne polarization camera and the experimental methods for single-event simulation on the ground.