Pingping Yao, Bihai Tu, Zhengyu Zou, Zhilong Xu, Aiwen Zhang, Liang Sun, Donggen Luo, Jin Hong. Single event latch-up and damage mechanism of analog front-end for satellite-borne polarization camera[J]. Infrared and Laser Engineering, 2022, 51(3): 20210226
- Infrared and Laser Engineering
- Vol. 51, Issue 3, 20210226 (2022)
Fig. 1. Structure diagram of DPC instrument
Fig. 2. Structure of CCD image acquisition system
Fig. 3. single-particle online detection system. (a) Principle block diagram; (b) Photo of AFE in radiation field
Fig. 4. Pulsed laser single event test. (a) Experimental site; (b) The processing flow
Fig. 5. Structure diagram of power supply for AFE
Fig. 6. Schematic diagram of heat simulation after SEL
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Table 1. Ion parameters of heavy ion irradiation test
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Table 2. AFE test data of heavy ion irradiation
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Table 3. Test data of pulsed laser irradiation
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Table 4. Increased power consumption of optical detector after SEL of the AFE
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Table 5. Calculation results of working temperature after SEL
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