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    Journals >Photonics Research >Volume 8 >Issue 12 >Page 1818 > Article
    • Photonics Research
    • Vol. 8, Issue 12, 1818 (2020)
    Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy
    Jiaji Li1,2, Alex Matlock3, Yunzhe Li3, Qian Chen1..., Lei Tian3,4 and Chao Zuo1,2,*|Show fewer author(s)
    Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
  • 2Smart Computational Imaging Laboratory (SCILab), Nanjing University of Science and Technology, Nanjing 210094, China
  • 3Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts 02215, USA
  • 4e-mail: leitian@bu.edu
    • show less
    DOI: 10.1364/PRJ.403873 Cite this Article Set citation alerts
    Jiaji Li, Alex Matlock, Yunzhe Li, Qian Chen, Lei Tian, Chao Zuo, "Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy," Photonics Res. 8, 1818 (2020) Copy Citation Text show less
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    Jiaji Li, Alex Matlock, Yunzhe Li, Qian Chen, Lei Tian, Chao Zuo, "Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy," Photonics Res. 8, 1818 (2020)
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