Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy

Jiaji Li; Alex Matlock; Yunzhe Li; Qian Chen; Lei Tian; Chao Zuo

doi:10.1364/PRJ.403873

Journals >Photonics Research >Volume 8 >Issue 12 >Page 1818 > Article

Photonics Research
Vol. 8, Issue 12, 1818 (2020)

Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy

Jiaji Li^1、2, Alex Matlock³, Yunzhe Li³, Qian Chen¹, Lei Tian^3、4, and Chao Zuo^1、2、*

Author Affiliations

¹School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China

²Smart Computational Imaging Laboratory (SCILab), Nanjing University of Science and Technology, Nanjing 210094, China

³Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts 02215, USA

⁴e-mail: leitian@bu.edu

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DOI: 10.1364/PRJ.403873 Cite this Article Set citation alerts

Jiaji Li, Alex Matlock, Yunzhe Li, Qian Chen, Lei Tian, Chao Zuo. Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy[J]. Photonics Research, 2020, 8(12): 1818 Copy Citation Text

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