• Laser & Optoelectronics Progress
  • Vol. 59, Issue 6, 0617030 (2022)
Ying Ji1、*, Xinyu Wei1, Mingming Zhang2, and Yawei Wang1
Author Affiliations
  • 1School of Physics and Electronic Engineering, Jiangsu University, Zhenjiang , Jiangsu 212013, China
  • 2School of Mechanical Engineering, Jiangsu University, Zhenjiang , Jiangsu 212013, China
  • show less
    DOI: 10.3788/LOP202259.0617030 Cite this Article Set citation alerts
    Ying Ji, Xinyu Wei, Mingming Zhang, Yawei Wang. Experimental Sampling Strategy for Rapid Extraction of Morphological Features Based on Phase Edge Detection[J]. Laser & Optoelectronics Progress, 2022, 59(6): 0617030 Copy Citation Text show less

    Abstract

    To address the problem of how to select appropriate edge sampling points in the phase distribution map, in this paper, we analyze the advantages and disadvantages of different processing schemes and propose a sampling strategy based on phase imaging theory and experiments. Combined with the phase imaging mechanism, several gradient-based classical edge detection operators were used to analyze the source of uncertainty in the position of sampling feature points and its influence on the detection results. Actual samples showing a morphological structure with different complexities were selected to conduct experimental research. Furthermore, the influence of different sampling points on the sample size calculation results was compared and analyzed. Subsequently, the causes of various errors were investigated and their theoretical correlation and explanation were presented. Based on the results of a comparative analysis of multiple groups of experimental data, a morphological structure feature extraction scheme suitable for samples with different complexities was proposed. The processing efficiency of this scheme can meet the needs of a rapid real-time detection.
    Ying Ji, Xinyu Wei, Mingming Zhang, Yawei Wang. Experimental Sampling Strategy for Rapid Extraction of Morphological Features Based on Phase Edge Detection[J]. Laser & Optoelectronics Progress, 2022, 59(6): 0617030
    Download Citation