• Journal of Infrared and Millimeter Waves
  • Vol. 40, Issue 6, 715 (2021)
Yu-Qiang GU1、2, Ming TAN2, Yuan-Yuan WU2, Jian-Ya LU2, Xue-Fei LI1、2, and Shu-Long LU2、*
Author Affiliations
  • 1Institute of Nano-Tech and Nano-Bionics,University of Science and Technology of China,Hefei 230026,China
  • 2Key Laboratory of Nano-devices and Applications,Suzhou Institute of Nano-Tech and Nano-Bionics,Chinese Academy of Sciences,Suzhou 215123,China
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    DOI: 10.11972/j.issn.1001-9014.2021.06.002 Cite this Article
    Yu-Qiang GU, Ming TAN, Yuan-Yuan WU, Jian-Ya LU, Xue-Fei LI, Shu-Long LU. InAlAs/InGaAs avalanche photodiode with an optimized multiplication layer[J]. Journal of Infrared and Millimeter Waves, 2021, 40(6): 715 Copy Citation Text show less
    Structure of InAlAs/InGaAs APD
    Fig. 1. Structure of InAlAs/InGaAs APD
    (a)The 3-dB bandwidth vs multiplication factor with different multiplication layer thickness,and (b)the gain-bandwidth product vs multiplication layer thickness
    Fig. 2. (a)The 3-dB bandwidth vs multiplication factor with different multiplication layer thickness,and (b)the gain-bandwidth product vs multiplication layer thickness
    Distribution of electric field as a function of multiplication layer thickness
    Fig. 3. Distribution of electric field as a function of multiplication layer thickness
    (a)Measured and Calculated I-V characteristic,(b)multiplication gain vs voltage,and (c)C-V characteristic of the InAlAs/InGaAs APD
    Fig. 4. (a)Measured and Calculated I-V characteristic,(b)multiplication gain vs voltage,and (c)C-V characteristic of the InAlAs/InGaAs APD
    3-dB bandwidth vs voltage
    Fig. 5. 3-dB bandwidth vs voltage
    (a)Measured and Calculated frequency characteristic,and (b)3-dB bandwidth vs multiplication gain of fabricated InAlAs/InGaAs APD
    Fig. 6. (a)Measured and Calculated frequency characteristic,and (b)3-dB bandwidth vs multiplication gain of fabricated InAlAs/InGaAs APD
    ParametersUnitsInGaAsInAlAs
    Band gapeV0.751.42
    Align0.360.36
    Permittivity13.912.2
    Electron SRH lifetimes4×10-81×10-18
    Hole SRH lifetimes4×10-81×10-18
    Electron mobilitycm2/V·s10 0003 000
    Hole mobilitycm2/V·s150250
    Radiative recombination coefficientcm3/s9.6×10-11.2×10-10
    Table 1. Material parameters used in SILVACO physical modeling
    Yu-Qiang GU, Ming TAN, Yuan-Yuan WU, Jian-Ya LU, Xue-Fei LI, Shu-Long LU. InAlAs/InGaAs avalanche photodiode with an optimized multiplication layer[J]. Journal of Infrared and Millimeter Waves, 2021, 40(6): 715
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