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    Journals >Laser & Optoelectronics Progress >Volume 60 >Issue 3 >Page 0312013 > Article
    • Laser & Optoelectronics Progress
    • Vol. 60, Issue 3, 0312013 (2023)
    Surface Topography Measurement Technology Based on Optical Frequency Comb
    Guanhao Wu†、*, Liheng Shi1、†, and Erge Li
    Author Affiliations
  • State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China
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    DOI: 10.3788/LOP223339 Cite this Article Set citation alerts
    Guanhao Wu, Liheng Shi, Erge Li. Surface Topography Measurement Technology Based on Optical Frequency Comb[J]. Laser & Optoelectronics Progress, 2023, 60(3): 0312013 Copy Citation Text show less
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    Article index updated: Jun. 17, 2024
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
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    Guanhao Wu, Liheng Shi, Erge Li. Surface Topography Measurement Technology Based on Optical Frequency Comb[J]. Laser & Optoelectronics Progress, 2023, 60(3): 0312013
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    Paper Information
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