• Chinese Optics Letters
  • Vol. 18, Issue 5, 051301 (2020)
Tianying Lin1、2, Ze Chen1、2, Xiaopei Zhang1、2, He Li1、2, Xiaoping Liu1、2、*, and Haibin Lü1、2、**
Author Affiliations
  • 1National Laboratory of Solid State Microstructures and College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
  • 2Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China
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    DOI: 10.3788/COL202018.051301 Cite this Article Set citation alerts
    Tianying Lin, Ze Chen, Xiaopei Zhang, He Li, Xiaoping Liu, Haibin Lü. Experimental observation of topologically protected defect states in silicon waveguide arrays[J]. Chinese Optics Letters, 2020, 18(5): 051301 Copy Citation Text show less
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    Tianying Lin, Ze Chen, Xiaopei Zhang, He Li, Xiaoping Liu, Haibin Lü. Experimental observation of topologically protected defect states in silicon waveguide arrays[J]. Chinese Optics Letters, 2020, 18(5): 051301
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