Experimental observation of topologically protected defect states in silicon waveguide arrays

Tianying Lin; Ze Chen; Xiaopei Zhang; He Li; Xiaoping Liu; Haibin Lü

doi:10.3788/COL202018.051301

Journals >Chinese Optics Letters >Volume 18 >Issue 5 >Page 051301 > Article

Chinese Optics Letters
Vol. 18, Issue 5, 051301 (2020)

Experimental observation of topologically protected defect states in silicon waveguide arrays

Tianying Lin^1、2, Ze Chen^1、2, Xiaopei Zhang^1、2, He Li^1、2, Xiaoping Liu^1、2、*, and Haibin Lü^1、2、**

Author Affiliations

¹National Laboratory of Solid State Microstructures and College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China

²Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China

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DOI: 10.3788/COL202018.051301 Cite this Article Set citation alerts

Tianying Lin, Ze Chen, Xiaopei Zhang, He Li, Xiaoping Liu, Haibin Lü. Experimental observation of topologically protected defect states in silicon waveguide arrays[J]. Chinese Optics Letters, 2020, 18(5): 051301 Copy Citation Text

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